American Elements
Hafnium Sputtering Target
Hf
7440-58-6
Product
Product Code
Order or Specifications
99% Hafnium Sputtering Target
HF-M-02-ST
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99.5% Hafnium Sputtering Target
HF-M-025-ST
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99.9% Hafnium Sputtering Target
HF-M-03-ST
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99.95% Hafnium Sputtering Target
HF-M-035-ST
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99.99% Hafnium Sputtering Target
HF-M-04-ST
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99.999% Hafnium Sputtering Target
HF-M-05-ST
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See research below. American Elements specializes in producing high purity Hafnium sputtering targets with the highest possible density and smallest possible average grain sizes for use in semiconductor, chemical vapor deposition (CVD) and physical vapor deposition (PVD) display and optical applications. Our standard Sputtering Targets for thin film are available monoblock or bonded with dimensions and configurations up to 820 mm with hole drill locations and threading, beveling, grooves and backing designed to work with both older sputtering devises as well as the latest process equipment, such as large area coating for solar energy or fuel cells and flip-chip applications. Research sized targets are also produced as well as custom sizes and alloys. All targets are analyzed using best demonstrated techniques including X-Ray Fluorescence (XRF), Glow Discharge Mass Spectrometry (GDMS), and Induction Plasma Spectrometry (ICP). "Sputtering" allows for thin film deposition of an ultra high purity sputtering metallic or oxide material onto another solid substrate by the controlled removal and conversion of the target material into a directed gaseous/plasma phase through ionic bombardment. We can also provide targets outside this range in addition to just about any size rectangular, annular, or oval target. Materials are produced using crystallization, solid state and other ultra high purification processes such as sublimation. American Elements specializes in producing custom compositions for commercial and research applications and for new proprietary technologies. American Elements also casts any of the rare earth metals and most other advanced materials into rod, bar or plate form, as well as other machined shapes and through other processes such as nanoparticles (See also application discussion at Nanotechnology Information and at Quantum Dots) and in the form of solutions and organometallics.

Hafnium is replacing polysilicon as the principle gate or electrode material in metal oxide semiconductor field effect transistors (MOSFETs) which are the basis for all modern semiconductors. As semiconductors have gotten smaller, the limiting factor in further size reduction has been the ability of the silicon oxide gate to perform below 10 angstroms where leakage occurs. Recent research has been devoted to the development of High-k materials which can function as a di-electric barrier or gate with lower leakage. Using hafnium based alloys as this di-electric gate has allowed for the development of MOSFET gates smaller than 10 angstroms. This allows for further size reduction, reduced switching power requirements and improved performance.

We also produce Hafnium as disc, granules, ingot, pellets, pieces, powder, and rod. Other shapes are available by request.

Hafnium is a Block D, Group 4, Period 6 element. The electronic configuration is [Xe] 4f14 5d2 6s2. In its elemental form hafnium's CAS number is 7440-58-6. The hafnium atom has a radius of 156.4.pm and it's Van der Waals radius is 200.pm.

Formula CAS No. Appearance Molecular Weight
Hf 7440-58-6 silver 178.49
PRODUCT CATALOG Submicron & Nanopowder Tolling Ultra High Purity Sputtering Target Crystal Growth Rod, Plate, Powder, etc.
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Recent Research & Development for Hafnium Metal

  • Self-assembly and crystallization behavior of mesoporous, crystalline HfO2 thin films: a model system for the generation of mesostructured transition-metal oxides.
    Small. 2005 Aug;1(8-9):889-98.

  • Guanidinate-Stabilized Monomeric Hafnium Amide Complexes as Promising Precursors for MOCVD of HfO2.
    Inorg Chem. 2006 Dec 25;45(26):11008-18.

  • A stable Schrock-type hafnium-silylene complex.
    J Am Chem Soc. 2006 Dec 20;128(50):16024-5. No abstract available.

  • Dinitrogen functionalization with bis(cyclopentadienyl) complexes of zirconium and hafnium.
    Dalton Trans. 2007 Jan 7;(1):16-25. Epub 2006 Nov 23.

  • Recent progress in polar stationary phases for CEC.
    Electrophoresis. 2006 Nov 29; [Epub ahead of print]

  • Antimony-antimony bond formation by reductive elimination from a hafnium bis(stibido) complex.
    Inorg Chem. 2006 Nov 27;45(24):9625-7.

  • Analysis of FT-IR spectra of dicyclopentadienyl (bis-substituted cyclopentadienyl) dithiocyano of titanium, zirconium and hafnium.
    Spectrochim Acta A Mol Biomol Spectrosc. 2006 Sep 24; [Epub ahead of print]

  • Syntheses and X-ray crystal structures of zirconium(IV) and hafnium(IV) complexes containing monovacant wells-Dawson and Keggin polyoxotungstates.
    Inorg Chem. 2006 Oct 2;45(20):8108-19.

  • N-C bond formation promoted by a hafnocene dinitrogen complex: comparison of zirconium and hafnium congeners.
    J Am Chem Soc. 2006 Aug 23;128(33):10696-7. No abstract available.

  • Group 4 transition-metal atom reactions with CS2 and OCS: infrared spectra and density functional calculations of SMCS, SM-(eta2-CS), SMCO, and OMCS in solid argon.
    J Phys Chem A Mol Spectrosc Kinet Environ Gen Theory. 2006 Nov 30;110(47):12785-92.

 

 

 

 

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